Rigaku

NEX DE

manufacturer

PRODUCT OVERVIEW


As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.
 

XRF elemental analysis in the field, plant or lab Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

XRF with 60 kV X-ray tube and SDD detector The 60 kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD). 

XRF options: autosampler, vacuum, helium and standardless FP Options include fundamental parameters, a variety of automatic sample changers, sample spinner and helium purge or vacuum atmosphere for enhanced light element sensitivity. 

Silicon drift detector technology

A silicon drift detector (SDD) affords extremely high count rate capability with excellent spectral resolution. This enables NEX DE to deliver the highest precision analytical results in the shortest possible measurement times. The unique engineering feature of SDD is the transversal field generated by a series of ring electrodes that forces charge carriers to “drift” to a small collection electrode. Current generation SDD detectors, with the fi eld effect transistor (FET) moved out of the radiation path, represent the state of the art in conventional EDXRF detector technology.



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KEY FEATURES

  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 60 kV X-ray tube for wide elemental coverage
  • FAST SDD® detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters

MEASURES

The NEX DE model is fitted with the latest release SDD Detector. As well as offering high count throughputs, it has superior resolution ability.

An example is for analysis of Rare Earth Element(REE) ore bodies. The lanthanide group element provide for a closely clustered spectrum wher good resolving power is required to separate each element in the lanthanide series.

The improved sensitivity has many applications including:

  • QC measurement of coating/film thickness applied to sheet material. the DE  detector is able to provide micron accuracies for the process.
  • Stripping of gold in the cyanide leaching process where the empirical lower limit of detection approaches 0.3ppm.
  • Plating thickness on metal components
  • Rare Earth Element analysis
  • Measurement of metals in aerosols on air filters: Cadmium, Lead, Mercury, Selenium, Arsenic, Gallium, Barium

SPECIFICATIONS


Dimensions
35.6(W) X 35.1(D) X 26.0(H) cm
Weight
<27 kg

NEX DE
Gold stripping to barren solution
Gold stripping to barren solution

Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to setup either an empirical or fundamental parameters application.
Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to setup either an empirical or fundamental parameters application.


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The NEX DE employs a 50 kV X-ray tube, and Peltier cooled semiconductor detector technology to deliver exceptional short-term repeatability and long-term reproducibility with excellent elemental peak resolution.


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