Rigaku

NEX QC+ QuantEZ

manufacturer

PRODUCT OVERVIEW


As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ series add to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants - such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma - the NEX QC+ QuantEZ series is the reliable choice for routine elemental analysis.
 

The shuttered 50kV X-ray tube and Peltier cooled Silicon Drift Detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

Silicone Drift Detector technology

A silicon drift detector (SDD) aff ords extremely high count rate capability with excellent spectral resolution. This enables NEX QC+ QuantEZ to deliver the highest precision analytical results in the shortest possible measurement times. The unique engineering feature of SDD is the transversal fi eld generated by a series of ring electrodes that forces charge carriers to “drift” to a small collection electrode. Current generation SDD detectors, with the fi eld eff ect transistor (FET) moved out of the radiation path, represent the state of the art in conventional EDXRF detector technology



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KEY FEATURES

  • Analyze ₁₁Na to ₉₂U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior resolution
  • Multiple automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters

 

SPECIFICATIONS


Dimensions
33.1(W) X 43.2(D) X 37.6(H) cm
Weight
16 kg (35 lbs)
Excitation
50 kV X-ray tube, 4 W max power, 6 tube filter positions with shutter
Detection
High performance semiconductor detector, Peltier thermo-electric cooling
Sample chamber
Large 190 x 165 x 60 mm sample chamber

NEX QC+ QuantEZ
Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to setup either an empirical or fundamental parameters application.
Based on the famous Rigaku easy-to-use flow bar interface, QuantEZ software walks the user through steps required to setup either an empirical or fundamental parameters application.

NEX QC+ QuantEZ


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The NEX QC QuantEZ series employs a 50 kV X-ray tube and Peltier cooled semiconductor detector technology to deliver exceptional short-term repeatability and long-term reproducibility with excellent elemental peak resolution.


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