Rigaku

Next-generation Cartesian Geometry EDXRF Analyzer. As a multi-element, multi-purpose EDXRF spectrometer, the powerful second-generation NEX CG II delivers rapid qualitative and quantitative elemental analyses and addresses the needs for many applications. Rigaku NEX CG II is ideal for measuring ultra-low and trace element concentrations up to percent levels. It provides non-destructive analysis of sodium (Na) to uranium (U) in almost any matrix — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

NEX CG II builds on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace level sensitivity.
It features a unique three-dimensional (3D) closecoupled Cartesian Geometry optical kernel that dramatically increases the peak-to-background ratio. This results in a spectrometer capable of trace element analysis — even in challenging sample types.

Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology.

NEX CG II achieves this superior analytical power with a 50 kV 50 W end-window palladium-anode X-ray tube, five secondary targets covering the complete elemental range sodium through uranium (Na – U), and a large-area highthroughput silicon drift detector (SDD). Users can achieve the lowest limits of detection and easily manage complex applications like testing agricultural soils, and plant materials, analyzing fi nished animal feeds, measuring waste oils, environmental monitoring, and many others.