Rigaku
NEX DE VS EDXRF Spectrometer

PRODUCT OVERVIEW
As a premium high performance small spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with easy-to-learn Windows-based QuantEZ software. Non-destructively analyse from sodium through to uranium in almost any matrix, from solids and alloys to powders, liquids, slurries and RoHS materials.
This analyser offers multi-position bulk analysis in addition to a large single position sample stage, with three analysis spot size
options - 1 mm, 3 mm and 10 mm - that are easily changeable by the system's automatic collimators. A high resolution camera and LED lighting system allows a sample's image to be recorded via the Windows software interface.
The powerful 60kV X-ray tube and Peltier cooled FAST SDD® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).
XRF options: autosampler, helium and standardless FP Options include fundamental parameters, a variety of automatic sample
changers, sample spinner and helium purge for enhanced light element sensitivity.
KEY FEATURES
- Analyze ₁₁Na to ₉₂U non-destructively
- Powerful QuantEZ Windows-based software
- High resolution camera
- 1, 3 or 10 mm analysis spot size
- Solids, liquids, alloys, powders and films
- 60kV X-ray tube for wide elemental coverage
- FAST SDD detector for superior data
- Six automated tube filters
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters